I am trying to model reflectivity data at a Mn-doped GaAs interface and hence I need to create a Kramers-Kronig Transform to determine the depth-dependent complex value of the index of refraction at specific beam energies.  The integral I am trying to solve is the following:
f[1](omega) = P(2/(Pi)*(∫)[0]^(infinity)(u*f[2](u))/(u^(2) - omega^(2))du),